iV_oc-to-V_oc loss as a measure for the recombination at the metal-semiconductor interfaces J_0,met, pFF-to-FF loss as a measure for the cell's series resistance R_ser and solar cell efficiency from an intermediate experiment comparing the pitch of the rear metallization pattern of 1080 μm as used in last year's publication [14] to a smaller pitch of 800 μm as used in the present study.