Fig. 4
Download original image
iVoc-to-Voc loss as a measure for the recombination at the metal-semiconductor interfaces J0,met and pFF-to-FF loss as a measure for the cell's series resistance Rser for a rear AlOx capping thickness of 60 nm in last year's publication [13] and a follow-up experiment with ∼15 nm thicker capping.
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.