Issue |
EPJ Photovolt.
Volume 14, 2023
Special Issue on ‘Recent Advances in Spectroscopy and Microscopy of Thin-films Materials, Interfaces, and Solar Cells 2021', edited by A. Vossier, M. Gueunier-Farret, J.-P. Kleider and D. Mencaraglia
|
|
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Article Number | 40 | |
Number of page(s) | 13 | |
Section | Semiconductor Thin Films | |
DOI | https://doi.org/10.1051/epjpv/2023031 | |
Published online | 22 December 2023 |
https://doi.org/10.1051/epjpv/2023031
Original Article
Investigations on photovoltaic material absorptivity using hyperspectral photoluminescence excitation imaging
1
EDF R&D, 91120 Palaiseau, France
2
Institut Photovoltaïque d'Ile de France (IPVF), 91120 Palaiseau, France
3
UMR IPVF 9006, CNRS, Ecole Polytechnique Institut Polytechnique de Paris, PSL Chimie ParisTech, IPVF SAS, 91120 Palaiseau, France
4
Lumière, Matière et Interfaces (LuMIn) Laboratory, Université Paris-Saclay, ENS Paris-Saclay, CNRS, CentraleSupelec, 91190 Gif-sur-Yvette, France
* e-mail: mlegrand@g.ecc.u-tokyo.ac.jp
Received:
29
June
2022
Received in final form:
29
September
2023
Accepted:
16
November
2023
Published online: 22 December 2023
Photoluminescence imaging has become a standard method to characterize solar cells. However, performing some quantitative analysis of this technique requires the assumption of uniform local absorptivity, which cannot be directly measured using traditional methods. This study presents a novel approach to measure the local relative absorptivity over a broad spectral range for a perovskite absorber deposited on a charge extraction layer and an electrode. By analyzing the photoluminescence intensity as a function of the incident photon energy, we were able to determine the relative absorptivity of the incident light above the bandgap energy. Additionally, luminescence spectra allow us to accurately assess the absorptivity near the bandgap energy from the reciprocity between absorption and emission. Reflectivity measurements were also performed to further understand the possible limitations of our experiment and to discuss our results. Finally, this method was able to distinguish between variations in the photoluminescence response caused by slight differences in the local film thickness and changes in the local carrier lifetime.
Key words: Hyperspectral imaging / photoluminescence excitation spectroscopy / absorptivity / reflectance
© M. Legrand et al., Published by EDP Sciences, 2023
This is an Open Access article distributed under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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