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All issues Volume 8 (2017) EPJ Photovolt., 8 (2017) 85505 References
Issue
EPJ Photovolt.
Volume 8, 2017
Topical Issue: Theory and modelling
Article Number 85505
Number of page(s) 12
Section Theory and modelling
DOI https://doi.org/10.1051/epjpv/2017006
Published online 01 August 2017
  1. P.M. Fahey, P. Griffin, J. Plummer, Rev. Mod. Phys. 61, 289 (1989) [Google Scholar]
  2. C. Persson, Y.J. Zhao, S. Lany, A. Zunger, Phys. Rev. B 72, 035211 (2005) [Google Scholar]
  3. C. Freysoldt, B. Grabowski, T. Hickel, J. Neugebauer, G. Kresse, A. Janotti, C.G. Van de Walle, Rev. Mod. Phys. 86, 253 (2014) [Google Scholar]
  4. S. Lany, A. Zunger, Phys. Rev. B 78, 235104 (2008) [Google Scholar]
  5. A. Alkauskas, P. Deák, J. Neugebauer, A. Pasquarello, C.G. Van de Walle, Advanced Calculations for Defects in Materials: Electronic Structure Methods (John Wiley & Sons, 2011) [Google Scholar]
  6. A. Stoneham, Theory of Defects in Solids: Electronic Structure of Defects in Insulators and Semiconductors, Oxford classic texts in the physical sciences (Clarendon Press, 2001) [Google Scholar]
  7. G. Makov, M. Payne, Phys. Rev. B 51, 4014 (1995) [Google Scholar]
  8. C. Varvenne, F. Bruneval, M.C. Marinica, E. Clouet, Phys. Rev. B 88, 134102 (2013) [Google Scholar]
  9. F. Bruneval, C. Varvenne, J.P. Crocombette, E. Clouet, Phys. Rev. B 91, 024107 (2015) [Google Scholar]
  10. H. Peng, D.O. Scanlon, V. Stevanovic, J. Vidal, G.W. Watson, S. Lany, Phys. Rev. B 88, 115201 (2013) [Google Scholar]
  11. S. Lany, A. Zunger, Phys. Rev. Lett. 98, 045501 (2007) [CrossRef] [PubMed] [Google Scholar]
  12. A. Kolpak, S. Ismail-Beigi, Phys. Rev. B 83, 165318 (2011) [Google Scholar]
  13. A. Satta, F. Willaime, S. de Gironcoli, Phys. Rev. B 57, 11184 (1998) [Google Scholar]
  14. P. Erhart, K. Albe, A. Klein, Phys. Rev. B 73, 205203 (2006) [Google Scholar]
  15. V. Kosyak, N.B. Mortazavi Amiri, A.V. Postnikov, M.A. Scarpulla, J. Appl. Phys. 114, 124501 (2013) [Google Scholar]
  16. T. Zacherle, P.C. Schmidt, M. Martin, Phys. Rev. B 87, 235206 (2013) [Google Scholar]
  17. A.J. Jackson, A. Walsh, Phys. Rev. B 88, 165201 (2013) [Google Scholar]
  18. M. de Koning, C.R. Miranda, A. Antonelli, Phys. Rev. B 66, 104110 (2002) [Google Scholar]
  19. Y. Mishin, M.R. Sorensen, A.F. Voter, Philos. Mag. A 81, 2591 (2001) [CrossRef] [Google Scholar]
  20. O.K. Al-Mushadani, R.J. Needs, Phys. Rev. B 68, 235205 (2003) [Google Scholar]
  21. A. Sholihun, M. Saito, T. Ohno, T. Yamasaki, Jpn J. Appl. Phys. 54, 041301 (2015) [Google Scholar]
  22. L. Shi, L.W. Wang, Phys. Rev. Lett. 109, 245501 (2012) [CrossRef] [PubMed] [Google Scholar]
  23. D. Maroudas, R.A. Brown, Phys. Rev. B 47, 15562 (1993) [Google Scholar]
  24. S. Chiesa, P.M. Derlet, S.L. Dudarev, Phys. Rev. B 79, 214109 (2009) [Google Scholar]
  25. S.J. Clark, G.J. Ackland, Phys. Rev. B 48, 10899 (1993) [Google Scholar]
  26. P.J. Ungar, T. Halicioglu, W.A. Tiller, Phys. Rev. B 50, 7344 (1994) [Google Scholar]
  27. B. Grabowski, T. Hickel, J. Neugebauer, Phys. Stat. Sol. (b) 248, 1295 (2011) [CrossRef] [Google Scholar]
  28. A. Glensk, B. Grabowski, T. Hickel, J. Neugebauer, Phys. Rev. X 4, 011018 (2014) [Google Scholar]
  29. F.H. Stillinger, T.A. Weber, Phys. Rev. B 31, 5262 (1985) [Google Scholar]
  30. S.E. Taylor, F. Bruneval, Phys. Rev. B 84, 075155 (2011) [Google Scholar]
  31. E. Rauls, T. Frauenheim, Phys. Rev. B 69, 155213 (2004) [Google Scholar]
  32. S. Dannefaer, P. Mascher, D. Kerr, Phys. Rev. Lett. 56, 2195 (1986) [CrossRef] [PubMed] [Google Scholar]
  33. P.E. Blöchl, E. Smargiassi, R. Car, D.B. Laks, W. Andreoni, S.T. Pantelides, Phys. Rev. Lett. 70, 2435 (1993) [CrossRef] [PubMed] [Google Scholar]
  34. M. Lannoo, G. Allan, Phys. Rev. B 25, 4089 (1982) [Google Scholar]
  35. M.J. Puska, S. Pöykkö, M. Pesola, R.M. Nieminen, Phys. Rev. B 58, 1318 (1998) [Google Scholar]
  36. P. Śpiewak, K.J. Kurzydłowski, Phys. Rev. B 88, 195204 (2013) [Google Scholar]
  37. A.F. Wright, Phys. Rev. B 74, 165116 (2006) [Google Scholar]
  38. F. Corsetti, A.A. Mostofi, Phys. Rev. B 84, 035209 (2011) [Google Scholar]
  39. W. Gao, A. Tkatchenko, Phys. Rev. Lett. 111, 045501 (2013) [CrossRef] [PubMed] [Google Scholar]
  40. G. Watkins, J. Troxell, A. Chatterjee, Defects and radiation effects in semiconductors, 1978 (1979) [Google Scholar]
  41. J.A. Van Vechten, C.D. Thurmond, Phys. Rev. B 14, 3539 (1976) [Google Scholar]
  42. S. Baroni, S. de Gironcoli, A. Dal Corso, P. Giannozzi, Rev. Mod. Phys. 73, 515 (2001) [Google Scholar]
  43. G. Kresse, J. Furthmer, Phys. Rev. B 54, 11169 (1996) [Google Scholar]
  44. G. Kresse, D. Joubert, Phys. Rev. B 59, 1758 (1999) [Google Scholar]
  45. D. Alfè, Computer Physics Communications 180, 2622 (2009) [Google Scholar]
  46. J.P. Perdew, K. Burke, M. Ernzerhof, Phys. Rev. Lett. 77, 3865 (1996) [Google Scholar]
  47. Y. Okada, Y. Tokumaru, J. Appl. Phys. 56, 314 (1984) [Google Scholar]
  48. M. Probert, M. Payne, Phys. Rev. B 67, 075204 (2003) [Google Scholar]
  49. M. Ganchenkova, L. Oikkonen, V. Borodin, S. Nicolaysen, R. Nieminen, Materials Science and Engineering: B 107, 159160 (2009) [Google Scholar]
  50. G.A. Baraff, E.O. Kane, M. Schlüter, Phys. Rev. B 21, 5662 (1980) [Google Scholar]
  51. G. Henkelman, B.P. Uberuaga, H. Jónsson, J. Chem. Phys. 113, 9901 (2000) [Google Scholar]
  52. M.J. Puska, S. Pöykkö, M. Pesola, R.M. Nieminen, Phys. Rev. B 58, 1318 (1998) [Google Scholar]
  53. J. Van Vechten, Phys. Rev. B 33, 8785 (1986) [Google Scholar]
  54. U. Gerstmann, E. Rauls, H. Overhof, T. Frauenheim, Phys. Rev. B 65, 195201 (2002) [Google Scholar]
  55. B. Fultz, Progress in Materials Science 55, 247 (2010) [Google Scholar]
  56. D.S. Kim, H.L. Smith, J.L. Niedziela, C.W. Li, D.L. Abernathy, B. Fultz, Phys. Rev. B 91, 014307 (2015) [Google Scholar]
  57. A. Debernardi, S. Baroni, E. Molinari, Phys. Rev. Lett. 75, 1819 (1995) [CrossRef] [PubMed] [Google Scholar]
  58. A. Debernardi, Phys. Rev. B 57, 12847 (1998) [Google Scholar]
  59. K. Esfarjani, G. Chen, H.T. Stokes, Phys. Rev. B 84, 085204 (2011) [Google Scholar]
  60. J. Fernandez, A. Monti, R. Pasianot, Phys. Stat. Sol. (b) 219, 245 (2000) [CrossRef] [Google Scholar]
  61. S.A. Centoni, B. Sadigh, G.H. Gilmer, T.J. Lenosky, T. Díaz de la Rubia, C.B. Musgrave, Phys. Rev. B 72, 195206 (2005) [Google Scholar]
  62. F. Bruneval, J.P. Crocombette, Phys. Rev. B 86, 140103 (2012) [Google Scholar]
  63. S. Wei, M.Y. Chou, Phys. Rev. B 50, 2221 (1994) [Google Scholar]
  64. G. Ackland, M. Warren, S. Clark, J. Phys.: Condens. Matter 9, 7861 (1997) [CrossRef] [Google Scholar]
  65. B. Grabowski, L. Ismer, T. Hickel, J. Neugebauer, Phys. Rev. B 79, 134106 (2009) [Google Scholar]
  66. F. Ercolessi, J.B. Adams, Europhys. Lett. 26, 583 (1994) [Google Scholar]
  67. S. Hobday, R. Smith, J. Belbruno, Modelling and Simulation in Materials Science and Engineering 7, 397 (1999) [Google Scholar]
  68. S. Bukkapatnam, M. Malshe, P. Agrawal, L. Raff, R. Komanduri, Phys. Rev. B 74, 224102 (2006) [Google Scholar]

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