Illustrative correlation plot for LS1 of Cell 3.1 in terms of J_SC vs V_OC. The figure shows how experimental and simulated correlation pathways are compared within the proposed framework. Each simulated mechanism is averaged over ≈100 simulated devices and each coloured area represents a 95% confidence interval. For degradation, the same material parameters are varied in the opposite direction (e.g. defect healing becomes defect formation). The black arrow indicates the sense of performance increase, towards higher V_OC and J_SC. The full mechanism list is given in the legend, grouped by layer: yellow for perovskite, blue for HTL, purple for ETL, orange for interfaces, and green for parasitic resistances. The square and polygon drawn in the plot illustrate the scoring regions: trajectories within the polygon correspond to good agreement, those within the square but outside the polygon to moderate agreement, and those outside the square to poor agreement.