Fig. 4


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Results on an EL image of test sample 1. From left to right: (i) on-the-fly contacted EL image, (ii) full-image-trained model prediction, (iii) patch-trained model prediction, (iv) Wiener-deblurred output (for comparison), (v) still EL image (as reference). (Top row) full wafer EL image, (bottom row) enlarged section at the position indicated by the orange square.

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