Fig. 3


Download original image

The top graph shows the specific contact resistance ρc measured with a TLM-Scan+ device from PV-Tools for varying peak set temperature in “°C”. The bottom graph shows the corresponding ECV profiles for each TOPCon layer including both the phosphorus in the poly-Si (constant part) and the c-Si tail (strongly decreasing part).

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.