Fig. 1


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TOP: A PL image of a over fired wafer, indicating nine individual fields F1-F9 with varying Finger pitches in “mm”. On the edges TLM structures are located. Middle: An implied iVoc Mod-PL image of a selected sample showing no field pattern, but other significant inhomogeneities. The iVoc as a result from the indicated line scan area is shown in the bottom graph.

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