Fig. 3

thumbnail

Download original image

Absorption coefficient of pm-Si:H absorber layer in p-i-n devices fabricated on Asahi SnO2, LPCVD ZnO and sp-e ZnO substrates versus photon energy measured by FTPS. The absolute scaling is made relative to i-layer on Corning glass measured by photothermal deflection spectroscopy (PDS).

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.