Fig. 3


Download original image

Optical emission spectra measured during the deposition of amorphous (top) and microcrystalline thin film silicon (bottom). Some prominent optical emission peaks and band structures are labelled.

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.