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Fig. 8


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Evolution of (a) pseudo-dielectric function of a pm-Si :H PIN layer stack on Corning Eagle glass at various stages of light-soaking, as measured by spectroscopic ellipsometry, and of material parameters as extracted from the measured spectra : (b) optical bandgap Eopt, (c) density parameter A, (d) disorder parameter C, and (e) surface roughness.

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