| Issue |
EPJ Photovolt.
Volume 17, 2026
Special Issue on ‘EU PVSEC 2025: State of the Art and Developments in Photovoltaics', edited by Robert Kenny and Carlos del Cañizo
|
|
|---|---|---|
| Article Number | 25 | |
| Number of page(s) | 15 | |
| DOI | https://doi.org/10.1051/epjpv/2026017 | |
| Published online | 03 July 2026 | |
https://doi.org/10.1051/epjpv/2026017
Original Article
Impact of cell cracks on performance of PV modules with current cell technologies
1
Hochschule Anhalt - Anhalt University of Applied Sciences, Bernburger Str. 55, 06366 Köthen, Germany
2
Fraunhofer Center for Silicon Photovoltaics CSP, Otto-Eissfeldt-Str. 12, 06120 Halle (Saale), Germany
* e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
Received:
30
September
2025
Accepted:
5
June
2026
Published online: 3 July 2026
Abstract
Cracks in photovoltaic modules can affect power output, but their relevance depends on module architecture and operating conditions. This study examines how crack length and crack number relate to power loss in 230 mono-Si mini-modules spanning full-cell PERC and half-cut TOPCon technologies with busbar counts from 2 to 12, focusing exclusively on cell line cracks that do not lead to electrically isolated cell parts. Electroluminescence images were used to quantify crack characteristics and busbars, while current–voltage measurements at 200 W/m2 and 1000 W/m2 were used to extract series resistance, shunt resistance, and maximum power point. Correlation analysis was then used to assess how crack characteristics relate to electrical performance. The results show that crack length and crack number are not universal predictors of power loss in modern modules. PERC modules exhibit moderate crack–power correlations at low irradiance, but these correlations weaken at 1000 W/m2. TOPCon modules show no meaningful correlation at either irradiance level. The results indicate that crack sensitivity is governed primarily by irradiance, busbar count, and cell architecture, rather than by crack length alone.
Key words: PV modelling / electroluminescence / crack detection, power loss / shunt resistance
© A. Hashem et al., Published by EDP Sciences, 2026
This is an Open Access article distributed under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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