Supplementary Material

Figure S1: Example of multi-peak post-selection parameter distributions obtained with the GA for LS2 of Cell 3.1. Histograms comparing the initial population (blue) with the retained solutions after selection (orange) for perovskite electron mobility (top) and hole mobility (bottom). The selected distributions exhibit several peaks, indicating that multiple distinct parameter ranges can reproduce the experimental JV metrics within the prescribed tolerance. In such cases, the parameter is less tightly constrained by JV data alone than for parameters showing a single dominant peak.

Table S1: Device affiliation to split groups and inclusion in the analysis. Groups are defined by perovskite precursor preparation: solution timing (D0: prepared the same day; D-1: prepared one day in advance) and preheating prior to deposition (70 °C for 1 h vs none). Devices excluded from the analysis due to early failure or erratic measurement behaviour are identified in the table.

Table S2: Parameter inputs used for simulations of the devices studied. Fixed values have been obtained from experimental measures or the literature ([13,18]), while material parameter ranges present the values explored for LS and LID mechanisms. ETL and HTL stand for electron and hole transport layer, CB and VB for conduction and valence band, respectively.

© G. Álvarez Pérez et al., Published by EDP Sciences, 2026