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Cited article:

Impact of infrared rapid thermal annealing on molybdenum oxide films for improved surface passivation in textured silicon substrates

C. Ben Alaya, R. Benabderrahmane Zaghouani and M. Bouaicha
Journal of Materials Science: Materials in Electronics 36 (18) (2025)
https://doi.org/10.1007/s10854-025-15169-0