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Cited article:

Analysis of the degradation of amorphous silicon mini-modules under a severe sequential UV/DH test

Julia Vincent, Venkata Ramana Posa, Ali Khouzam, Pierre-Olivier Logerais, Mustapha El Yaakoubi, Anne Labouret

EPJ Photovolt., 14 (2023) 25

Published online: 2023-08-24

DOI: https://doi.org/10.1051/epjpv/2023014

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