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Cited article:

Understanding Inductor-Originated Single-Event Frequency Transients in CMOS LC -Tank Oscillators: Causes, Effects, and System Impacts

Gideon Adom-Bamfi, Qichao Ma, Stefan Biereigel, Paul Leroux and Jeffrey Prinzie
IEEE Transactions on Nuclear Science 72 (6) 1876 (2025)
https://doi.org/10.1109/TNS.2025.3572895

Single-Event Effect Responses of CMOS Integrated Planar Multiturn Inductors in LC-Tank Oscillators Under Heavy-Ion Microbeam Irradiation

Gideon Adom-Bamfi, Stefan Biereigel, Paul Leroux and Jeffrey Prinzie
IEEE Transactions on Nuclear Science 71 (7) 1380 (2024)
https://doi.org/10.1109/TNS.2024.3414841

Simultaneous measurement of charge carrier concentration, mobility, and lifetime

Dávid Krisztián, Ferenc Korsós and Gergely Havasi
Solar Energy Materials and Solar Cells 260 112461 (2023)
https://doi.org/10.1016/j.solmat.2023.112461