Open Access
EPJ Photovolt.
Volume 10, 2019
Article Number 3
Number of page(s) 6
Section Bulk Silicon
Published online 06 June 2019
  1. P.Y. Rosenwaks, S. Saraf, O. Tal, A. Schwarzman, D.T. Glatzel, P.D.M.C. Lux-Steiner, Kelvin probe force microscopy of semiconductors, in Scanning Probe Microscopy, edited by S. Kalinin, A. Gruverman (Springer, New York, 2007), pp. 663–689 [CrossRef] [Google Scholar]
  2. P. Narchi et al., Cross-sectional investigations on epitaxial silicon solar cells by kelvin and conducting probe atomic force microscopy: effect of illumination, Nanosc. Res. Lett. 11 , 55 (2016) [CrossRef] [Google Scholar]
  3. L. Kronik et al., Surface photovoltage spectroscopy of semiconductor structures: at the crossroads of physics, chemistry and electrical engineering, Surf. Interface Anal. 31 , 954 (2001) [Google Scholar]
  4. V. Donchev et al., Surface photovoltage phase spectroscopy − a handy tool for characterisation of bulk semiconductors and nanostructures, Mater. Sci. Eng. B 129 , 186 (2006) [CrossRef] [Google Scholar]
  5. V. Donchev et al., A surface photovoltage spectroscopy system used for minority carrier diffusion length measurements on floating zone silicon, J. Optoelectr. Adv. Mater. 7 , 533 (2015) [Google Scholar]
  6. Silvaco Inc., ATLAS user's manual (2012). Available at [Google Scholar]
  7. Y. Huang et al., A new approach to modelling Kelvin probe force microscopy of hetero-structures in the dark and under illumination, Opt. Quant. Electr. 50 , 41 (2018) [CrossRef] [Google Scholar]
  8. R.C. Newman, Defects in silicon, Rep. Prog. Phys. 45 , 1163 (1982) [Google Scholar]
  9. B. Stegemann et al., Passivation of Crystalline Silicon Wafers by Ultrathin Oxide Layers: Comparison of Wet-chemical, Plasma and Thermal Oxidation Techniques, in IEEE 7th World Conference on Photovoltaic Energy Conversion (2018) [Google Scholar]

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