Fig. 6


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Development of the dark current characteristics for all CdTe (a-c) and CIGS (d-e) test modules during 1 h to 1632 h of dark storage. The high-bias region for the FS-262 module (c) is shown in detail with fitted diode parameters (f). (Note: the variation in storage hours between different models occurred by experimental circumstances and has no further meaning).

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