Fig. 5


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Temperature dependent dark current characteristics of CdTe (a-c) and CIGS (d-e) thin film test modules. The dashed lines indicate the different slopes of the D1 and D2 regimes. The magnified shunt-region for the FS-262 module is also shown (f). (Note: the CIGS modules incorporate a bypass diode, which inhibits continuation of the dark IV curve in the reverse bias direction).

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