Fig. 5
Download original image
Temperature dependent dark current characteristics of CdTe (a-c) and CIGS (d-e) thin film test modules. The dashed lines indicate the different slopes of the D1 and D2 regimes. The magnified shunt-region for the FS-262 module is also shown (f). (Note: the CIGS modules incorporate a bypass diode, which inhibits continuation of the dark IV curve in the reverse bias direction).
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.