Table 1
Classification proposal for selected observations; ditto always refer to the “after manufacturing” numbers.
| Type of EL anomaly | After manufacturing: end of line inspection | After installation | In the field | After severe weather events |
|---|---|---|---|---|
| Single complete crack (Sect. 3.1.1) | ≤6BB: max. 5 >6BB: max. 5 |
Ditto | +1 per 5 years | +5 |
| Single incomplete crack (Sect. 3.1.2) | ≤6BB: max. 1 >6BB: max. 5 |
Ditto | +1 per 5 years | +5 |
| Dendritic crack structures (Sect. 3.2.3) | ≤6BB: not allowed >6BB: not allows |
Ditto | Ditto | 1 per PV module, follow-up inspection required |
| Tiny X-V cracks (Sect. 3.2.4) | ≤6BB: max. 1 >6BB: max. 2 |
Ditto | +1 per 5 years | +5 |
| Finger interruptions per image type a) (Sect. 3.3.1) | Single finger interruptions: ≤6BB: max. 20 per cell >6BB: max. 30 per cell |
Ditto | Ditto | Ditto |
| Finger interruptions per image type b) (Sect. 3.3.1) | Multiple interruptions at BB ≤6BB: not allowed >6BB: max. 1 per cell and 5 per 100 cells |
Ditto | +1 per 5 years | Ditto |
| Complete dark cells (Sect. 3.3.3) | ≤6BB: not allowed >6BB: not allowed |
Ditto | Replace PV module | Replace PV module |
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