Fig. 3


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SEM cross section images of a non-passivated sample for different RTP peak firing temperatures (400 °C left, 500 °C middle, 700 °C right). At 400 °C, there are large Te crystallites (bright blue arrow) as well as smaller Bi2TeO5 crystals (white arrows) visible, whereas the crystallization diminishes for higher peak temperatures. For 700 °C Te crystallites grown into the Si wafer are visible.

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