Fig. 3
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Surface topographic structure of the compact TiO2, so films were grown by DC-sputtering with different powers. Using AFM scanning two and three dimensions for (a,e) 180 W, (b, f) 200 W, (c, g) 220 W and (d, h) 240 W. In addition, showing changing grains size of C-TiO2 using SEM scanning for (i) 180 W, (j) 200 W, (k) 220 W and (l) 240 W. AFM images were 5 × 5 μm2 scale.
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