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Polarization-type potential-induced degradation in bifacial PERC modules in the field

Peter Hacke, Cecile Molto, Dylan Colvin, Ryan Smith, Farrukh Ibne Mahmood, Fang Li, Jaewon Oh, Govindasamy Tamizhmani and Hubert Seigneur

EPJ Photovolt., 16 (2025) 16

Published online: 24 February 2025

DOI: 10.1051/epjpv/2025004

Peter Hacke

Cecile Molto

Dylan Colvin

Ryan Smith

Farrukh Ibne Mahmood

Fang Li

Jaewon Oh

Govindasamy Tamizhmani

Hubert Seigneur

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Editor-in-Chief: Pere Roca i Cabarrocas, Jean-Louis Lazzari - Editorial board
eISSN: 2105-0716