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In-situ determination of the effective absorbance of thin μc-Si:H layers growing on rough ZnO:Al

Matthias Meier, Karsten Bittkau, Ulrich W. Paetzold, Jürgen Hüpkes, Stefan Muthmann, Ralf Schmitz, Andreas Mück and Aad Gordijn

EPJ Photovolt., 4 (2013) 40602

Published online: 02 October 2013

DOI: 10.1051/epjpv/2013025

Matthias Meier

Karsten Bittkau

Ulrich W. Paetzold

Jürgen Hüpkes

Stefan Muthmann

Ralf Schmitz

Andreas Mück

Aad Gordijn

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Editor-in-Chief: Pere Roca i Cabarrocas, Jean-Louis Lazzari - Editorial board
eISSN: 2105-0716