EPJ Photovoltaics

Optical evaluation of doping concentration in SiO₂ doping source layer for silicon quantum dot materials

T. Zhang, I. Perez-Wurlf, B. Berghoff, S. Suckow and G. Conibeer

EPJ Photovolt., 2 (2011) 25001

Published online: 29 September 2011

DOI: 10.1051/epjpv/2011024

T. Zhang

I. Perez-Wurlf

B. Berghoff

S. Suckow

G. Conibeer

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