EPJ Photovoltaics

A direct measure of positive feedback loop-gain due to reverse bias damage in thin-film solar cells using lock-in thermography

Suheir Nofal, Bart E. Pieters, Markus Hülsbeck, Christoph Zahren, Andreas Gerber and Uwe Rau

EPJ Photovolt., 14 (2023) 3

Published online: 09 January 2023

DOI: 10.1051/epjpv/2022030

Suheir Nofal

Bart E. Pieters

Markus Hülsbeck

Christoph Zahren

Andreas Gerber

Uwe Rau

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