Polarization-type potential-induced degradation in bifacial PERC modules in the fieldPeter Hacke, Cecile Molto, Dylan Colvin, Ryan Smith, Farrukh Ibne Mahmood, Fang Li, Jaewon Oh, Govindasamy Tamizhmani and Hubert SeigneurEPJ Photovolt., 16 (2025) 16DOI: https://doi.org/10.1051/epjpv/2025004
