Contactless defects detection using modulated photoluminescence technique: model for a single Shockley-Read-Hall trap in a semiconductor thin layerBaptiste Bérenguier, Alban Asseko, Hiba Haddara, Sylvain Le Gall, Jean-Paul Kleider and Jean-François GuillemolesEPJ Photovolt., 16 (2025) 11DOI: https://doi.org/10.1051/epjpv/2024045