Analysis of the degradation of amorphous silicon mini-modules under a severe sequential UV/DH testJulia Vincent, Venkata Ramana Posa, Ali Khouzam, Pierre-Olivier Logerais, Mustapha El Yaakoubi and Anne LabouretEPJ Photovolt., 14 (2023) 25DOI: https://doi.org/10.1051/epjpv/2023014
