A direct measure of positive feedback loop-gain due to reverse bias damage in thin-film solar cells using lock-in thermographySuheir Nofal, Bart E. Pieters, Markus Hülsbeck, Christoph Zahren, Andreas Gerber and Uwe RauEPJ Photovolt., 14 (2023) 3DOI: https://doi.org/10.1051/epjpv/2022030
