In-situ determination of the effective absorbance of thin μc-Si:H layers growing on rough ZnO:AlMatthias Meier, Karsten Bittkau, Ulrich W. Paetzold, Jürgen Hüpkes, Stefan Muthmann, Ralf Schmitz, Andreas Mück and Aad GordijnEPJ Photovolt., 4 (2013) 40602DOI: https://doi.org/10.1051/epjpv/2013025
