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Cited article:

Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives

Mattia da Lisca, José Alvarez, James P Connolly, Nicolas Vaissiere, Karim Mekhazni, Jean Decobert and Jean-Paul Kleider
Beilstein Journal of Nanotechnology 14 725 (2023)
https://doi.org/10.3762/bjnano.14.59