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Universal machine learning framework for defect predictions in zinc blende semiconductors

Arun Mannodi-Kanakkithodi, Xiaofeng Xiang, Laura Jacoby, Robert Biegaj, Scott T. Dunham, Daniel R. Gamelin and Maria K.Y. Chan
Patterns 3 (3) 100450 (2022)
DOI: 10.1016/j.patter.2022.100450
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