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Improvement of Laser-Crystallized Silicon Film Quality via Intermediate Dielectric Layers on a Glass Substrate

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ACS Omega 3 (5) 5846 (2018)
DOI: 10.1021/acsomega.8b00530
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Temperature and hydrogen diffusion length in hydrogenated amorphous silicon films on glass while scanning with a continuous wave laser at 532 nm wavelength

Wolfhard Beyer, Gudrun Andrä, Joachim Bergmann, et al.
Journal of Applied Physics 124 (15) 153103 (2018)
DOI: 10.1063/1.5038090
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Revealing Laser Crystallization Mechanism of Silicon Thin Films via Pulsed IR Lasers

Kamil Çınar, Cihan Yeşil and Alpan Bek
The Journal of Physical Chemistry C 124 (1) 976 (2020)
DOI: 10.1021/acs.jpcc.9b02103
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