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Cited article:

A direct measure of positive feedback loop-gain due to reverse bias damage in thin-film solar cells using lock-in thermography

Suheir Nofal, Bart E. Pieters, Markus Hülsbeck, Christoph Zahren, Andreas Gerber, Uwe Rau

EPJ Photovolt., 14 (2023) 3

Published online: 2023-01-09

DOI: https://doi.org/10.1051/epjpv/2022030

This article has been cited by the following article(s):

An electro-thermal finite element method (FEM) model for local hotspot kinetics in Cu(In, Ga)Se2 thin-film solar modules

Suheir Nofal, Timon S. Vaas, Uwe Rau and Bart E. Pieters
Journal of Applied Physics 136 (11) (2024)
https://doi.org/10.1063/5.0222051

Reverse-Bias Defect Creation in Cu(In,Ga)Se2 Solar Cells and Impact of Encapsulation

Timon Vaas, Bart Pieters, Andreas Gerber and Uwe Rau
Solar 3 (2) 184 (2023)
https://doi.org/10.3390/solar3020012