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Cited article:

Revealing Laser Crystallization Mechanism of Silicon Thin Films via Pulsed IR Lasers

Kamil Çınar, Cihan Yeşil and Alpan Bek
The Journal of Physical Chemistry C 124 (1) 976 (2020)
https://doi.org/10.1021/acs.jpcc.9b02103

Improvement of Laser-Crystallized Silicon Film Quality via Intermediate Dielectric Layers on a Glass Substrate

Kamil ÇINAR, Mehmet KARAMAN and Alpan BEK
ACS Omega 3 (5) 5846 (2018)
https://doi.org/10.1021/acsomega.8b00530

Temperature and hydrogen diffusion length in hydrogenated amorphous silicon films on glass while scanning with a continuous wave laser at 532 nm wavelength

Wolfhard Beyer, Gudrun Andrä, Joachim Bergmann, Uwe Breuer, Friedhelm Finger, Annett Gawlik, Stefan Haas, Andreas Lambertz, Florian C. Maier, Norbert H. Nickel and Uwe Zastrow
Journal of Applied Physics 124 (15) (2018)
https://doi.org/10.1063/1.5038090