Table 1
Summary of defective modules in this study.
| Defect type | # of modules | Range of power loss [%] | Module type | Details |
|---|---|---|---|---|
| Cell cracks | 8 | 4−5% | • Monofacial PERC 305 W | Cells cracked by mechanical stress test. Total of 69 cells affected. |
| Cell interconnections | 8 | 3−14% | • Monofacial PERC 305 W | Cell ribbon interconnection cut from the back sheet. Total of 98 cells affected. |
| PID | 6 | 5% | • Monofacial PERC 305 W | PID stress tested according to standard |
| Short-circuited bypass diode | 7 | 33−66% | • Monofacial PERC 305 W • Bifacial PERC 295 W • Bifacial PERC 540 W (Half-cut cells) |
4 modules with 1 Shorted diode and 3 with 2 Shorted diodes |
| Glass crack | 2 | <1% | • Bifacial PERC 540 W (Half-cut cells) | Glass cracked in front and rear side |
| Soiling 1 | 6 | 33% | • Monofacial PERC 305 W • Bifacial PERC 295 W • Bifacial PERC 540 W (Half-cut cells) |
Punctual soiling − Bird drops |
| Soiling 2 | 6 | 66% | • Monofacial PERC 305 W • Bifacial PERC 295 W • Bifacial PERC 540 W (Half-cut cells) |
Large area soiling − Sand |
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