Special Issue on ‘WCPEC-8: State of the Art and Developments in Photovoltaics’, edited by Alessandra Scognamiglio, Robert Kenny, Shuzi Hayase and Arno Smets
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Light-induced degradation (LID) expressed as relative efficiency (to initial) against cumulative irradiation dose for different module types at STC. Boxes represent the standard deviation of technology variation (k = 2) and error bars represent the measurement uncertainty (k = 2).
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