Revealing of InP multi-layer stacks from KPFM measurements in the dark and under illumination

Special Issue on ‘Recent Advances in Spectroscopy and Microscopy of Thin-films Materials, Interfaces, and Solar Cells 2021', edited by A. Vossier, M. Gueunier-Farret, J.-P. Kleider and D. Mencaraglia

Open Access

Fig. 3

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KPFM measurement in ambient conditions on the surface cross-section of the InP sample in dark conditions. (a) Topography image of the cross-section of the InP sample after chemical removal of the oxide layer. (b) The V _CPD image measured during the second pass. Two regions with different behavior were detected and labelled with 1 and 2. The resolution of the images is set to 1024 × 1024 pixels per point.

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