Fig. 4

image

Download original image

(a) X-ray diffraction pattern measured from a completed absorber. All of the indexed peaks can be attributed to the chalcopyrite phase of Cu(In,Ga)S2 (JCPDS#32–0339). (b) Focus on the (112) reflection of the completed absorber. The main contribution is centered at 28.02°, which corresponds to a GGI of 0.11.

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.