Fig. 4


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(a) X-ray diffraction pattern measured from a completed absorber. All of the indexed peaks can be attributed to the chalcopyrite phase of Cu(In,Ga)S2 (JCPDS#32–0339). (b) Focus on the (112) reflection of the completed absorber. The main contribution is centered at 28.02°, which corresponds to a GGI of 0.11.

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