Fig. 3
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(a) SEM cross section colorized with EDX intensities of In in blue and Ga in yellow, (b) SEM top view tilted, (c) SEM cross section image colorized with EDX intensity of Ag in green, (d) GDOES analysis of AgCIGSu on silicon. Raw intensities are corrected as described in the experimental section to give an estimation of atomic percentages in the AgCIGS film.
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