Table 3

Sensitivity to the defect density at the rear epi-Si/P-c-Si interface (Nss,   back) and to that at the front N-a-Si:H/epi-Si interface (Nss,   front).

Nss,   front Nss,   back 2.4 μm cell

(cm-2) (cm-2) Jsc Voc FF Efficiency
(mA cm-2) (V) (%)

1011 1010 16.63 0.592 0.748 7.37
1011 16.63 0.591 0.749 7.36
5 × 1011 16.63 0.582 0.758 7.34
1012 16.63 0.547 0.778 7.07
5 × 1012 16.61 0.394 0.663 4.35
1013 16.60 0.360 0.629 3.76

1010 1012 16.63 0.547 0.778 7.07
1011 16.63 0.547 0.778 7.07
5 × 1011 16.68 0.546 0.778 7.09
1012 16.75 0.542 0.780 7.09
5 × 1012 16.77 0.404 0.648 4.39
1013 16.41 0.369 0.596 3.61

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.