Open Access

Fig. 7


Download original image

(Color online) Raman spectrum of an ultra-thin c-Si film over a chromium/polyimide substrate. The left inset shows the Im [ε]  spectra of the film grown on c-Si before its detachment from the c-Si wafer while the right inset shows the sample after being removed from the c-Si wafer.

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.